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Production of High Quality Exfoliated Graphene

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Production of High Quality Exfoliated Graphene ( production-high-quality-exfoliated-graphene )

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ACS Nano www.acsnano.org Article Figure 2. (a,b) Transmission electron microscopy (TEM) image of single-layer graphene. (c) High magnification image from edge of the single-layer graphene. (d) Butterworth filtered image of section of part c. (e) Selected area electron diffraction (SAED) pattern of the single- layer graphene. (f,g) TEM of a bilayer graphene. (h) Edges of the bilayer graphene show two graphene layers. (i) Filtered image of part h. (j) SAED pattern. (k,l) TEM of trilayer graphene. (m) Edges of the trilayer graphene. (n) Filtered image of part m. (o) SAED pattern. (p) Atomic force microscope of graphene. (q) Height profile along the dotted green line in part p. (r) Thickness and (s) length histogram of 400 selected arbitrary graphene flakes obtained using AFM. (t) Low magnification SEM image of the exfoliated graphene (drop-cast graphene over Si wafer). rate) to get an idea about the parameter dependency on the exfoliation efficiency. The strategy behind choosing the process parameters has been discussed in Supporting Information S4. The plasma exposed graphite was collected and introduced to mild centrifugation (1000 rpm; 1 h) in deionized water to remove unexfoliated large agglomerates. After initial inspection using X-ray diffraction and Raman spectroscopy, we narrowed down to one parameter (plasma power (P): 40 kW, gas flow rate (G): 120 SCFH) which we presume is the best of the lot for exfoliated graphite (details about achieving the best parameter is included in Supporting Information S5−S8). Figure 1a shows the digital image of the exfoliated graphene. A total of 20 g of exfoliated graphene was obtained after ∼25 min of plasma spraying, indicating scale-up potential. The exfoliated graphene remained dispersed in organic solvents (NMP and DMF) for 48 h without any surfactant stabilization (Figure 1b,c).The exfoliated graphene displays reduced X-ray diffraction (002) peak intensity at 2θ = 26.5°(Figure 1d) https://dx.doi.org/10.1021/acsnano.0c09451 1777 ACS Nano 2021, 15, 1775−1784

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