GRAPHENE SYNTHESIS CHARACTERIZATION PROPERTIES

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GRAPHENE SYNTHESIS CHARACTERIZATION PROPERTIES ( graphene-synthesis-characterization-properties )

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14 Graphene – Synthesis, Characterization, Properties and Applications squares of the Au mesh are 10 μm × 10 μm in area, and the carbon aggregate in Fig. 12 (a) is a few tenth mm in scale. The magnified image of the thinnest area of the aggregate is shown in Fig. 12 (b). The uniform films covered one of the square holes of the mesh. Fig. 12 (c) is the diffraction patterns of the uniform area of Fig. 12 (b). Only sharp diffraction spots of graphene were observed, and moreover, no Ni signals were detected in X-rays analysis. Fig. 12. (a) A TEM image of a carbon aggregate on the Au mesh with squares 10 μm × 10 μm in area, (b) A magnified TEM image of the thinnest area of the carbon aggregate, and (c) its electron diffraction pattern. Fig. 13 shows (a) the TEM image of a slightly thicker area and (b) its diffraction pattern. All the spots are split in doublets in Fig. 13 (b). The observed area is covered with double-layer graphene sheets, of which the crystal orientations differs by 9 ゚ each others. We saw several diffraction patterns indicating different folding structures. Hence, the double layer seems to be formed by chance during the removing the Ni substrate. In the TEM image of the double-layer sheets, we observed CNT-like structures appeared as shown in Fig. 11 (a). The origin of the structure is not clear now. Fig. 14 shows the 532 nm Raman spectrum of the monolayer self-standing sheets. The two intense features are the G peak at ~1580cm-1 and the 2D peak at ~2700 cm-1. The single and sharp 2D peak in image indicates that the self-standing sheet has a thickness of only one atomic layer (Ferrari et al., 2006). In addition, small defect-origin D peak was detected at ~1350 cm-1. This proves that the high-quality graphene grows on Ni(111), which could be transferred to other substrates.

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